Electronic transitions and excitations in solid C70 studied by reflection electron energy loss spectroscopy

Surface excitations in surface electron spectroscopies studied by reflection electron energy-loss spectroscopy and elastic peak electron spectroscopy.

Surface excitations, in addition to bulk excitation, undergone by signal electrons in surface electron spectroscopies, such as Auger electron spectroscopy, and X-ray photoelectron spectroscopy, play an important role in the formation of electron spectra. Those inelastic scattering processes not only induce decay in the peak intensity, but also form background appearing in the lower kinetic ener...

Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering

We demonstrate that high-energy, high-resolution reflection electron energy loss spectroscopy can provide unique insights into interface formation, especially for the case where an extended interface is formed. By changing the geometry and/or electron energy the electronic structure can be probed over a range of thicknesses (from 10s of Å to more than 1000 Å). At the same time one resolves the ...

Surface microanalysis by reflection electron energy-loss spectroscopy.

Several basic physical concepts of applying eq. Ik = I sigma Nxt to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, sigma is the scattering cross section of element x with atomic concentration Nx, and t is the specimen thickness. The reflected inelastic el...

Electronic excitations of the YBa2Cu3O7-x superconductor: A study by transmission electron-energy-loss spectroscopy with an electron microprobe.

Oxygen incorporation in Ti2AlC thin films studied by electron energy loss spectroscopy and ab initio calculations